Author Search Results

1

Polarization-charge tunnel junctions for ultraviolet light-emitters without p-type contact

by: Schubert, Martin F.
In: Applied Physics Letters (2010)

E-Article

2

Finite element analysis of surface modes in phononic crystal waveguides

by: Guo, Yuning; Schubert, Martin; Dekorsy, Thomas
In: Journal of Applied Physics (2016)

E-Article

3

Effect of heterointerface polarization charges and well width upon capture and dwell time for electrons and holes above GaInN/GaN quantum wells

by: Schubert, Martin F.; Schubert, E. Fred
In: Applied Physics Letters (2010)

E-Article

4

Imaging of chromium point defects in p-type silicon

by: Habenicht, Holger; Schubert, Martin C.; Warta, Wilhelm
In: Journal of Applied Physics (2010)

E-Article

5

Origin of trapping in multicrystalline silicon

by: Gundel, Paul; Schubert, Martin C.; Warta, Wilhelm
In: Journal of Applied Physics (2008)

E-Article

6

Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission

by: Schubert, Martin C.; Isenberg, Joerg; Warta, Wilhelm
In: Journal of Applied Physics (2003)

E-Article

7

Separation of the surface and bulk recombination in silicon by means of transient photoluminescence

by: Heinz, Friedemann D.; Warta, Wilhelm; Schubert, Martin C.
In: Applied Physics Letters (2017)

E-Article

8

Microscopic charge carrier lifetime in silicon from a transient approach

by: Heinz, Friedemann D.; Kasemann, Martin; Warta, Wilhelm; Schubert, Martin C.
In: Applied Physics Letters (2015)

E-Article

9

High net doping concentration responsible for critical diode breakdown behavior of upgraded metallurgical grade multicrystalline silicon solar cells

by: Kwapil, Wolfram; Wagner, Matthias; Schubert, Martin C.; Warta, Wilhelm
In: Journal of Applied Physics (2010)

E-Article

10

Influence of heterogeneous profiles in carrier density measurements with respect to iron concentration measurements in silicon

by: Schubert, Martin C.; Kerler, Michael J.; Warta, Wilhelm
In: Journal of Applied Physics (2009)

E-Article

11

Quantitative carrier lifetime images optically measured on rough silicon wafers

by: Schubert, Martin C.; Pingel, Sebastian; The, Manuel; Warta, Wilhelm
In: Journal of Applied Physics (2007)

E-Article

12

Determination of spatially resolved trapping parameters in silicon with injection dependent carrier density imaging

by: Schubert, Martin C.; Riepe, Stephan; Bermejo, Sandra; Warta, Wilhelm
In: Journal of Applied Physics (2006)

E-Article

13

Wurtzite phonons and the mobility of a GaN/AlN 2D hole gas

by: Bader, Samuel James; Chaudhuri, Reet; Schubert, Martin F.; Then, Han Wui; Xing, Huili Grace; Jena, Debdeep
In: Applied Physics Letters (2019)

E-Article

14

On the implication of spatial carrier density non-uniformity on lifetime determination in silicon

by: Heinz, Friedemann D.; Giesecke, Johannes; Mundt, Laura E.; Kasemann, Martin; Warta, Wilhelm; Schubert, Martin C.
In: Journal of Applied Physics (2015)

E-Article

15

Main defect reactions behind phosphorus diffusion gettering of iron

by: Schön, Jonas; Vähänissi, Ville; Haarahiltunen, Antti; Schubert, Martin C.; Warta, Wilhelm; Savin, Hele
In: Journal of Applied Physics (2014)

E-Article

16

Effects of polarization-field tuning in GaInN light-emitting diodes

by: Xu, Jiuru; Schubert, Martin F.; Zhu, Di; Cho, Jaehee; Schubert, E. Fred; Shim, Hyunwook; ...
In: Applied Physics Letters (2011)

E-Article

17

Approach to the physical origin of breakdown in silicon solar cells by optical spectroscopy

by: Gundel, Paul; Kwapil, Wolfram; Schubert, Martin C.; Seifert, Holger; Warta, Wilhelm
In: Journal of Applied Physics (2010)

E-Article

18

Lambda shifted photonic crystal cavity laser

by: Schubert, Martin; Suhr, Troels; Ek, Sara; Semenova, Elizaveta S.; Hvam, Jørn M.; Yvind, Kresten
In: Applied Physics Letters (2010)

E-Article

19

Quantitative carrier lifetime measurement with micron resolution

by: Gundel, Paul; Heinz, Friedemann D.; Schubert, Martin C.; Giesecke, Johannes A.; Warta, Wilhelm
In: Journal of Applied Physics (2010)

E-Article

20

Diode breakdown related to recombination active defects in block-cast multicrystalline silicon solar cells

by: Kwapil, Wolfram; Kasemann, Martin; Gundel, Paul; Schubert, Martin C.; Warta, Wilhelm; Bronsveld, Paula; ...
In: Journal of Applied Physics (2009)

E-Article

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