Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission

Bibliographic Details
Authors and Corporations: Schubert, Martin C., Isenberg, Joerg, Warta, Wilhelm
Title: Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission
In: Journal of Applied Physics, 94, 2003, 6, p. 4139-4143
published:
AIP Publishing
Physical Description:4139-4143
ISSN/ISBN: 0021-8979
1089-7550
Type of Resource:E-Article
Source:AIP Publishing (CrossRef)
Language: Undetermined