@article{ ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA2My8xLjE2MDA1MzE, title = {Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission}, journal = {Journal of Applied Physics}, volume = {94}, number = {6}, pages = {4139-4143}, author = {Schubert, Martin C. and Isenberg, Joerg and Warta, Wilhelm}, publisher = {AIP Publishing}, year = {2003}, issn = {0021-8979}, issn = {1089-7550}, language = {English}, url = {http://dx.doi.org/10.1063/1.1600531}, url = {https://katalog.ub.uni-leipzig.de/Record/ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTA2My8xLjE2MDA1MzE} }