Imaging of chromium point defects in p-type silicon

Bibliographic Details
Authors and Corporations: Habenicht, Holger, Schubert, Martin C., Warta, Wilhelm
Title: Imaging of chromium point defects in p-type silicon
In: Journal of Applied Physics, 108, 2010, 3, p. 034909
published:
AIP Publishing
Physical Description:034909
ISSN/ISBN: 0021-8979
1089-7550
Type of Resource:E-Article
Source:AIP Publishing (CrossRef)
Language: English