Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

Bibliographic Details
Authors and Corporations: Grossmann, Martin, Schubert, Martin, He, Chuan, Brick, Delia, Scheer, Elke, Hettich, Mike, Gusev, Vitalyi, Dekorsy, Thomas
Title: Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics
In: New Journal of Physics, 19, 2017, 5, p. 053019
published:
IOP Publishing
Physical Description:053019
ISSN/ISBN: 1367-2630
Type of Resource:E-Article
Source:IOP Publishing (CrossRef)
Language: Undetermined