Grossmann, M., Schubert, M., He, C., Brick, D., Scheer, E., Hettich, M., Gusev, V., & Dekorsy, T.(2017). Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics. New Journal of Physics, 19(5), 053019. doi:10.1088/1367-2630/aa6d05

Grossmann, Martin, et al. "Characterization of Thin-film Adhesion and Phonon Lifetimes in Al/Si Membranes By Picosecond Ultrasonics". New Journal of Physics, 19.5 ( 2017 ): 053019.