Experimental evidence of electron capture and emission from trap levels in Cz silicon : Electron capture and emission from trap levels in Cz silicon

Bibliographic Details
Authors and Corporations: Heinz, Friedemann D., Niewelt, Tim, Schubert, Martin C.
Title: Experimental evidence of electron capture and emission from trap levels in Cz silicon : Electron capture and emission from trap levels in Cz silicon Electron capture and emission from trap levels in Cz silicon
In: physica status solidi (a), 214, 2017, 7, p. 1700292
published:
Wiley
Physical Description:1700292
ISSN/ISBN: 1862-6300
Type of Resource:E-Article
Source:Wiley (CrossRef)
Language: English