Imaging Interstitial Iron Concentrations in Gallium‐Doped Silicon Wafers

Bibliographic Details
Authors and Corporations: Post, Regina, Niewelt, Tim, Schön, Jonas, Schindler, Florian, Schubert, Martin C.
Title: Imaging Interstitial Iron Concentrations in Gallium‐Doped Silicon Wafers
In: physica status solidi (a), 216, 2019, 10, p. 1800655
published:
Wiley
Physical Description:1800655
ISSN/ISBN: 1862-6300
1862-6319
Type of Resource:E-Article
Source:Wiley (CrossRef)
Language: English