Details: Imaging Interstitial Iron Concentrations in Gallium‐Doped Silicon Wafers

Bibliographic Details
Authors and Corporations:	Post, Regina, Niewelt, Tim, Schön, Jonas, Schindler, Florian, Schubert, Martin C.
Title:	Imaging Interstitial Iron Concentrations in Gallium‐Doped Silicon Wafers
In:	physica status solidi (a), 216, 2019, 10, p. 1800655
published:	Wiley
Physical Description:	1800655
ISSN/ISBN:	1862-6300 1862-6319
Type of Resource:	E-Article
Source:	Wiley (CrossRef)
Language:	English