@article{ ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9wc3NhLjIwMTgwMDY1NQ, title = {Imaging Interstitial Iron Concentrations in Gallium‐Doped Silicon Wafers}, journal = {physica status solidi (a)}, volume = {216}, number = {10}, author = {Post, Regina and Niewelt, Tim and Schön, Jonas and Schindler, Florian and Schubert, Martin C.}, publisher = {Wiley}, year = {2019}, issn = {1862-6300}, issn = {1862-6319}, language = {English}, url = {http://dx.doi.org/10.1002/pssa.201800655}, url = {https://katalog.ub.uni-leipzig.de/Record/ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9wc3NhLjIwMTgwMDY1NQ} }