Submicron resolution carrier lifetime analysis in silicon with Fano resonances

Bibliographic Details
Authors and Corporations: Gundel, Paul, Schubert, Martin C., Heinz, Friedemann D., Benick, Jan, Zizak, Ivo, Warta, Wilhelm
Title: Submicron resolution carrier lifetime analysis in silicon with Fano resonances
In: physica status solidi (RRL) - Rapid Research Letters, 4, 2010, 7, p. 160-162
published:
Wiley
Physical Description:160-162
ISSN/ISBN: 1862-6254
1862-6270
Type of Resource:E-Article
Source:Wiley (CrossRef)
Language: English