Electrical characterization of the slow boron oxygen defect component in Czochralski silicon

Bibliographic Details
Authors and Corporations: Niewelt, Tim, Schön, Jonas, Broisch, Juliane, Warta, Wilhelm, Schubert, Martin
Title: Electrical characterization of the slow boron oxygen defect component in Czochralski silicon
In: physica status solidi (RRL) - Rapid Research Letters, 9, 2015, 12, p. 692-696
published:
Wiley
Physical Description:692-696
ISSN/ISBN: 1862-6254
Type of Resource:E-Article
Source:Wiley (CrossRef)
Language: English