APA Citation

Niewelt, T., Schön, J., Broisch, J., Rein, S., Haunschild, J., Warta, W., & Schubert, M C. (2015). Experimental Proof of the Slow Light-Induced Degradation Component in Compensated n-Type Silicon. Solid State Phenomena, 242, 102-108. doi:10.4028/www.scientific.net/ssp.242.102

MLA Citation

Niewelt, Tim, et al. "Experimental Proof of the Slow Light-Induced Degradation Component in Compensated N-Type Silicon". Solid State Phenomena, 242 (2015): 102-108.

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