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IEEE transactions on nuclear science: a publication of the IEEE Nuclear and Plasma Sciences Society

Institute of Electrical and Electronics Engineers
New York, NY: IEEE, 1963-
10.1963 -
Electronic Journal
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Characterization of Stress in Thallium Bromide Devices

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An SEU-Tolerant DICE Latch Design With Feedback Transistors

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Commemorative Issue for Particle Accelerator Conference

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IEEE Transactions on Nuclear Science information for authors

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2015 IEEE nuclear science symposium and medical imaging conference

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IEEE Transactions on Nuclear Science publication information

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[Front cover]

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